JPH01179290U - - Google Patents

Info

Publication number
JPH01179290U
JPH01179290U JP7646788U JP7646788U JPH01179290U JP H01179290 U JPH01179290 U JP H01179290U JP 7646788 U JP7646788 U JP 7646788U JP 7646788 U JP7646788 U JP 7646788U JP H01179290 U JPH01179290 U JP H01179290U
Authority
JP
Japan
Prior art keywords
electron beam
tester
trigger signal
variable delay
delay pulse
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7646788U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0747750Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1988076467U priority Critical patent/JPH0747750Y2/ja
Publication of JPH01179290U publication Critical patent/JPH01179290U/ja
Application granted granted Critical
Publication of JPH0747750Y2 publication Critical patent/JPH0747750Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Measurement Of Current Or Voltage (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP1988076467U 1988-06-08 1988-06-08 電子ビームテストシステム Expired - Lifetime JPH0747750Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1988076467U JPH0747750Y2 (ja) 1988-06-08 1988-06-08 電子ビームテストシステム

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1988076467U JPH0747750Y2 (ja) 1988-06-08 1988-06-08 電子ビームテストシステム

Publications (2)

Publication Number Publication Date
JPH01179290U true JPH01179290U (en]) 1989-12-22
JPH0747750Y2 JPH0747750Y2 (ja) 1995-11-01

Family

ID=31301492

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1988076467U Expired - Lifetime JPH0747750Y2 (ja) 1988-06-08 1988-06-08 電子ビームテストシステム

Country Status (1)

Country Link
JP (1) JPH0747750Y2 (en])

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0416379U (en]) * 1990-05-30 1992-02-10

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62219447A (ja) * 1986-03-20 1987-09-26 Fujitsu Ltd ストロボ電子ビ−ム装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62219447A (ja) * 1986-03-20 1987-09-26 Fujitsu Ltd ストロボ電子ビ−ム装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0416379U (en]) * 1990-05-30 1992-02-10

Also Published As

Publication number Publication date
JPH0747750Y2 (ja) 1995-11-01

Similar Documents

Publication Publication Date Title
JPH01179290U (en])
JPS63147082U (en])
JPH0363963U (en])
JPH022683U (en])
JPH029876U (en])
JPH0416379U (en])
JPS5648144A (en) Measurement equipment for characteristic of semiconductor device
JPS58129156U (ja) オシロスコ−プの掃引用トリガパルス発生回路
JPS53107001A (en) Automatic testing device for vehicle
JPS6167568U (en])
JPH0192645U (en])
JPS6454274A (en) Tester
JPS57169684A (en) Testing system for integrated circuit element
JPS62104577U (en])
JPH02101619U (en])
JPH0174561U (en])
JPH0174567U (en])
JPS53129941A (en) Test method for electronic device and test signal generator circuit
JPS609343U (ja) チユ−ナのミユ−テイングシステム
JPS5741466A (en) Device for generating ignition reference position signal
JPH0187447U (en])
JPS63113971U (en])
JPS5566844A (en) Electron beam generating apparatus
JPH0325190U (en])
JPS63181888U (en])